Deepak Musuwathi Ekanath

I am a technical authority in System-on-Chip (SoC) Characterization, focused on solving the toughest power and reliability challenges at advanced process nodes. My expertise is specifically in analyzing on-silicon behaviors like temperature inversion effects and abnormal static IDD simulation results. This deep knowledge allows me to develop highly optimized and reliable ATE test programs that not only verify function but also ensure the long-term quality and low-defect rate required by ASQ Six Sigma standards for critical, high-volume applications.